Park NX10 AFM
Located in the Advanced Instrumentation Facility
. Scanner: guided high-force flexure Z scanner, 5 µm (optional 30 µm), 0.015 nm resolution; single module flexure XY-scanner with closed-loop control, 50 µm × 50 µm (optional 10 µm × 10 µm or 100 µm × 100 µm), 0.05 nm resolution
. Range: 25 mm Z stage range, 15 mm focus travel range, 20 mm x 20 mm XY stage travel range
. Sample size: open space up to 100 mm x 100 mm, thickness up to 20 mm
. Software: SmartScan™, XEI data analysis software
. Options: temperature control, liquid probehand, liquid cells, magnetic field generator, clip-type Chip Carrier
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