X-Ray

Our Mission

The departmental x-ray diffraction facility at CCB is dedicated to the collection and analysis of high-quality x-ray diffraction data of materials of interest to the faculty and their collaborators. The physical forms of these materials include single- or poly- crystalline (powder) solids, liquid crystals, polymers (and bio-polymers), and deposits on substrates, mixtures and composites having good or poor crystallinity.

Our Services

Analyses include molecular and crystal structure determination (single-crystal or powder),finding lattice parameters, phase identification, percent crystallinity, crystal perfection (rocking curves), residual stress or texture analysis, orientation of crystallite planes and bulk crystal orientation for very large (1 – 30 mm) or very thin (<50 nm) single crystals.

The users of the x-ray facility (including trained students and technicians) are in complete compliance with radiation safety (NJ and Rutgers) and all applicable NJ state laws, and are trained on-site by the lab manager.

Our Rates

 

X-Ray User Type

Billing Rate*

Department Users Check with the department
External Users Contact the facility for availability and rates

*The billing rates are for the following systems and are subject to change: Bruker HiStar, Rigaku GeigerFlex DMAX, Bruker Smart APEX, and Philips XPert

 

Our Instruments

Bruker HiStar SystemBruker HiStar system
. Sensitive multi-wire area detector
. High-brilliance rotating Cu anode
. Parallel mirror optics
. Evacuated beam path
. Temperature range of -175 < T < 200 C
. 3-Circle orientation of large or small samples

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Rigaku GeigerFlex DMAX SystemRigaku GeigerFlex DMAX System
. Scintillation detector
. Sealed-tube Cu anode
. Focusing mirror optics
. Transmission mode, i.e., for capillaries
. Reflection mode, i.e., for bulk or films
. Open 2-Circles allows for large samples

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Bruker Smart APEX SystemBruker Smart APEX system
. Scintillation detector
. Sealed-tube Cu anode
. Focusing mirror optics
. Transmission mode, i.e., for capillaries
. Reflection mode, i.e., for bulk or films
. Open 2-Circles allows for large samples

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Philips XPert SystemPhilips XPert system
. Mini proportional counter detector
. Sealed-tube Cu anode
. Graphite monochromator
. Programmable receiving slit
. 15-sample changer; sample spinner
. Fixed sample; Bragg-Brentano geometry 

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Contact

Thomas J. Emge, Ph.D.
Chief Crystallographic Engineer
emge@rci.rutgers.edu
Tel: 848-445-2206
Fax: 732-445-5312

Location

Wright-Rieman Laboratories
610 Taylor Road
Piscataway, NJ 08854-8066